For electron backscatter diffraction (EBSD) users, typical measurement results consist of maps and charts displaying the microstructure of the sample. In many cases, these may simply be generic maps like inverse pole figure (IPF) and image quality (IQ) maps, which can easily be generated with a single mouse click. In addition to these basic analysis options, the EDAX OIM Analysis™ software offers an extensive range of analytical tools to quantify many of your materials’ microstructure components. Customization of your analyses allows targeted and highly detailed analysis of specific features of the microstructure. Additionally, the highlighting capabilities focus on one of the main strengths of EBSD analysis: the location of each measurement point is known and can be linked to all available displays. The incorporation of EBSD pattern reprocessing with spherical indexing extends the analytical capabilities to materials that simply could not be measured before.

To better lead users through all the capabilities, OIM Analysis 9.1 introduces a new ribbon bar layout that combines easy access to the basic analysis tools with powerful customization capabilities using templates. When a user needs to do repetitive analysis, for example, for quality control or to compare the microstructure of a set of samples after a series of experiments, an analysis needs only to be defined once in a template and can be easily repeated directly from the ribbon bar. Such templates can also be used to create custom reports that are automatically generated after data collection finishes. This webinar will guide you through the workflow and capabilities of OIM Analysis 9.1 from basic data analysis to automatic reporting.

Presenter:
   • Dr. René de Kloe, Applications Scientist, Edax